Strong

Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems) by Alvin W. Strong,Ernest Y. Wu,Rolf-Peter Vollertsen,Jordi Sune,Giuseppe La Rosa,Timothy D. Sullivan,Stewart E. Rauch III Wiley-Blackwell Hardcover 4 September 2009 from£114.27 | RRP: ~~£93.5~~
Vine's Concise Dictionary and Strong's Concise Concordance by William E Vine,W E Vine,James Strong,Robert Lightner STL Hardcover 30 August 1999 from£15.19 | RRP: ~~£19.99~~
Pocket Reads Year 2 Easy Order Pack (POCKET READERS FICTION) by Angela Royston,Haydn Middleton,Emma Lynch,Jill Atkins,Margaret Ryan,Ms Julia Donaldson,Jane Langford,Jeremy Strong,Mr John Escott,Mick Gowar,Ms Jillian Powell Ginn Paperback 18 July 2005 from£343.57 | RRP: ~~£254.5~~