High Resolution X-ray Diffractometry and Topography Book + PRICE WATCH * Amazon pricing is not included in price watch

High Resolution X-ray Diffractometry and Topography Book

The application of electronic materials has created a demand for reliable techniques for examining these materials. This book looks at the area of x-ray diffraction and the modern techniques available for deployment in research.Read More

from£158.20 | RRP: £90.00
* Excludes Voucher Code Discount Also available Used from £94.91
  • 0850667585
  • 9780850667585
  • D.K. Bowen, Brian K. Tanner
  • 5 February 1998
  • CRC Press
  • Hardcover (Book)
  • 264
  • 1
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