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Impurities and Defects in Group IV Elements and III-V Compounds / Störstellen und Defekte in Elementen der IV. Gruppe und III-V-Verbindungen ... Technology - New Series / Condensed Matter) Book
Subvolume III/22b of the Landolt-Börnstein New Series presents a comprehensive data compilation on defects and impurities in the elemental semiconductors and in the III-V compounds. Data on semiconductor defects were already included in the extended data collection on semiconductors in volumes III/17a...i. Research on semiconductor defects and impurities, however, advanced so rapidly during recent years that a new subvolume on this important topic seemed desirable. The information given in subvolume III/22b ranges from trends on defect properties as predicted by theory and a survey of diagnostic techniques to extensive tables and graphical representations of defect properties. The editor and the authors have endeavoured to find a unified form and to critically select the important and reliable information from the wide range of published data. Discussions of ambiguous results or textbook style explanations are avoided.Read More
from£1,975.05 | RRP: * Excludes Voucher Code Discount Also available Used from £140.14
- 3540179178
- 9783540179177
- C.A.J. Ammerlaan, W. Bergholz, B. Clerjaud, H. Ennen, H.G. Grimmeiss, B. Hamilton, U. Kaufmann, W.v. Münch, R. Murray, R.C. Newman, A.R. Peaker, G. Pensl, H.-J. Rath, R. Sauer, J. Schneider, M. Schulz, M.S. Skolnick, N.A. Stolwijk, P. Vogl, A.F.W. Willoughby
- 12 December 1989
- Springer
- Hardcover (Book)
- 776
- Revised edition
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