HOME | BESTSELLERS | NEW RELEASES | PRICE WATCH | FICTION | BIOGRAPHIES | E-BOOKS |
+ PRICE WATCH
* Amazon pricing is not included in price watch
Optical Metrology Book
Covers the four optical metrology techniques of holographic interferometry, moire techniques, speckle methods and photoelasticity in a single volume. Designed for the practical student of optical metrology, it can be divided into two parts. The first introduces the reader to the classical optical phenomena of wave propagation, interference, diffraction and polarization with simple explanations of coherence, imaging and optical filtering. Explanations are kept very simple, without getting involved in complicated electromagnetic theory and the coverage is restricted to those aspects necessary to understand the techniques in part two. The second part deals with optical metrology techniques with an introduction to the basic principles of interferometry, holography, speckle methods, moire-techniques, two- and three- dimensional photoelasticity, fibre optic sensors and other optical techniques. A particular feature is the special emphasis on modern applications such as video techniques, (including an extensive treatment of the video camera), digital image processing, polarizing state vectors and fibre optics.Read More
from£N/A | RRP: * Excludes Voucher Code Discount Also available Used from £N/A
- 0471912468
- 9780471912460
- Kjell J. Gåsvik
- 8 April 1987
- John Wiley & Sons
- Hardcover (Book)
- 244
As an Amazon Associate we earn from qualifying purchases. If you click through any of the links below and make a purchase we may earn a small commission (at no extra cost to you). Click here to learn more.
Would you like your name to appear with the review?
We will post your book review within a day or so as long as it meets our guidelines and terms and conditions. All reviews submitted become the licensed property of www.find-book.co.uk as written in our terms and conditions. None of your personal details will be passed on to any other third party.
All form fields are required.