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Scanning Electron Microscopy and X-ray Microanalysis Book
* Excludes Voucher Code Discount Also available Used from £50.67
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Blackwell
This text provides students as well as practitioners (engineers, technicians, physical and biological scientists, clinicians, and technical managers) with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X...
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ASDA
An ideal text for students as well as practitioners this is a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described.
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Pickabook
Joseph I. Goldstein, Dale E. Newbury, D.C. Joy
- 0306472929
- 9780306472923
- Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael
- 31 January 2003
- Springer
- Hardcover (Book)
- 689
- 3rd ed. 2003. Corr. 4th printing
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