Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale: v. 1&2 Book + PRICE WATCH * Amazon pricing is not included in price watch

Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale: v. 1&2 Book

Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography. Read More

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  • 0387286675
  • 9780387286679
  • Sergei V. Kalinin, Alexei Gruverman
  • 29 December 2006
  • Springer
  • Hardcover (Book)
  • 1020
  • 1
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