HOME | BESTSELLERS | NEW RELEASES | PRICE WATCH | FICTION | BIOGRAPHIES | E-BOOKS |
+ PRICE WATCH
* Amazon pricing is not included in price watch
Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale: v. 1&2 Book
Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography. Read More
from£N/A | RRP: * Excludes Voucher Code Discount Also available Used from £N/A
- 0387286675
- 9780387286679
- Sergei V. Kalinin, Alexei Gruverman
- 29 December 2006
- Springer
- Hardcover (Book)
- 1020
- 1
As an Amazon Associate we earn from qualifying purchases. If you click through any of the links below and make a purchase we may earn a small commission (at no extra cost to you). Click here to learn more.
Would you like your name to appear with the review?
We will post your book review within a day or so as long as it meets our guidelines and terms and conditions. All reviews submitted become the licensed property of www.find-book.co.uk as written in our terms and conditions. None of your personal details will be passed on to any other third party.
All form fields are required.