VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon) Book + PRICE WATCH * Amazon pricing is not included in price watch

VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon) Book

A comprehensive guide to DFT methods that shows the readers how to design a testable and quality product drive down test cost improve product quality and yield and speed up time-to-market and time-to-volume. It provides coverage of design for testability. It presents coverage of industry practices commonly found in commercial DFT tools.Read More

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  • Blackwell

    This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to...

  • Pickabook

    Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen

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